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From: wleklin@maat.mct.anl.gov
Date: Thu Jun 20 1996 - 00:37:18 EEST

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Hello,

I am a student researcher at Argonne National Laboratory doing reverse
engineering. We are interested in dimensionally comparing x-ray CT image files
of a rapid prototype to original CAD files. I'm interested in knowing about any
applications in which image slices or 3-D point clouds and CAD slices or 3-D
drawings may be viewed and analyzed together.

Regards,

Joe

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