At 04:37 PM 6/19/96 CDT, you wrote:
> I am a student researcher at Argonne National Laboratory doing reverse
>engineering. We are interested in dimensionally comparing x-ray CT image files
>of a rapid prototype to original CAD files. I'm interested in knowing about any
>applications in which image slices or 3-D point clouds and CAD slices or 3-D
>drawings may be viewed and analyzed together.
Imageware has tools for doing what you described. Information is available
on-line at www.iware.com or we could snail mail product information sheets
if you so desire. Best of luck.
Tom Landrey Imageware (313)994-7300
313 N. First St. FAX (313)994-7303
Ann Arbor, MI 48102 email@example.com
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