RE: reverse engineering benchmarking

From: Yasser Hosni (
Date: Tue Aug 27 2002 - 03:23:29 EEST

Reverse Engineering (RE) is a broad field. For example, surface scanning is considered RE, so as the CT/MRI. In conducting bench marking (BM) studies, one need to consider categorizing RE so that a meaningful BM can be developed.
In addition, the technologies employed are different, with advantages and deficiencies in certain areas. Hence there is a need for BMing within each technology. Examples include regular laser scanning (for capturing the geometrical configuration/ measurements) and color laser scanning (for capturing the colors objects).
I am sure BM can be developed, however, one has to be careful in its development.
Take care.
Yasser Hosni, Ph.D., PE.
Martin Marietta Distinguished Professor
Industrial Engineering and Management Systems
University of Central Florida
4000 Central Florida Blvd.
Orlando, FL 32816
Tel (407) 823-5817
Fax (407) 823-3413

>>> "Ping Fu" <> 08/26/02 01:46PM >>>
In my extensive market research, I have not seen complete benchmark
done in this industry sector. If anyone is interested in doing so, it
surely will
benefit the community. I've seen a few benchmark done by university
customers, but all are incomplete and some are not allowed to be


-----Original Message-----
From: [] On
Behalf Of Alain BERNARD
Sent: Monday, August 26, 2002 1:12 PM
To: George Hatzilias
Subject: RE: reverse engineering benchmarking

Dear Giorgos ,

We might be impressed by the content of such websites and of the
numerous of sensors. But I wonder if a general method of benchmarking
has been proposed for all these sensors and technology. I also know some
initiatives but for some given sectors.

Any information about that?

Best Regards,


At 10:37 21/08/2002 -0400, you wrote:
>These lists are a good start:
>Georgia Tech has done some work on standardized benchmarking of these
>systems, contact Dr. Tom Kurfess, a professor in metrology and head of
>the precision manufacturing research lab at
>I beleive he has published a few papers on benchmarking and comparing
>such systems.
>I would also be glad to share from my experience as a former engineer
>from Paraform, where I was exposed to most every major scanner
>available at some point or other. I now help operate a scanning service

>beareau scanning from small micron scale parts to full size vehicles,
>glad to share any insight on particular scanners.
>Giorgos Hatzilias
>Slingshot PDG
>3675 Crestwood Pkwy Suite 400
>Duluth, GA 30096
>----- Original Message -----
>From: "simon ram" <>
>To: <>
>Sent: Sunday, August 18, 2002 5:37 AM
>Subject: reverse engineering benchmarking
>> Does anybody know or has employed a benchmark to evaluate the
>> performances
>of the different reverse engineering systems ?
>> I would be very interested in receiving this information and if is it
>possible the model file or information about it.
>> I'm interested mainly interested in working with structured light,
>> laser
>scanner and touch probe systems.
>> Thank you very much for the help, any suggestions or information
>> about
>reverse engineering benchmarking will be very interesting
>> Regards
>> Simon
>> ---------------------------------
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Prof. Alain BERNARD
Ecole Centrale de Nantes
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44321 - NANTES Cedex 03 (France)
tel : + 33 (0) 2 40 37 69 53
fax : + 33 (0) 2 40 37 69 30 -=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=

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